The recently launched S-3400N variable-pressure scanning electron microscope from Hitachi High-Technologies has improved display and signalmixing facilities for versatility of operation.
Up close and personal
In addition to its array of automated facilities, the S-3400N features the GUI first introduced on the S-4800 FESEM. Facilities include a fullscreen mode that makes almost the entire screen available for image observation, to enable rapid location of features of interest.
A small-screen display provides for local area X-ray scanning or image optimisation. There is also a new real-time dual-image display to allow images from two different detectors to be displayed together. Each image may be adjusted independently and the signals can also be mixed. This allows a combined image to be produced from, for example, secondary electron and backscattered electron detectors.
The GUI display is configurable to allow display of the essential control functions and also has an animation that illustrates routine maintenance tasks such as changing a filament.